Characterization
The X-ray diffraction (XRD) patterns of the C600 and C800 samples are displayed in Fig. 2, highlighting their crystalline structures. Characteristic peaks were detected at diffraction angles (2Ɵ) of 18.46, 30.53, 35.88, 37.55,…
The X-ray diffraction (XRD) patterns of the C600 and C800 samples are displayed in Fig. 2, highlighting their crystalline structures. Characteristic peaks were detected at diffraction angles (2Ɵ) of 18.46, 30.53, 35.88, 37.55,…